<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-25T20:39:35Z</responseDate><request verb="GetRecord" identifier="oai:www.repository.cam.ac.uk:1810/373085" metadataPrefix="uketd_dc">https://api.repository.cam.ac.uk/server/oai/request</request><GetRecord><record><header><identifier>oai:www.repository.cam.ac.uk:1810/373085</identifier><datestamp>2024-08-31T00:44:09Z</datestamp><setSpec>com_1810_198332</setSpec><setSpec>com_1810_256064</setSpec><setSpec>col_1810_214775</setSpec></header><metadata><uketd_dc:uketddc xmlns:uketd_dc="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:uketdterms="http://naca.central.cranfield.ac.uk/ethos-oai/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/ http://naca.central.cranfield.ac.uk/ethos-oai/2.0/uketd_dc.xsd">
   <dc:title>Development of graphene growth surfaces for III-V semiconductors</dc:title>
   <dc:identifier xsi:type="dcterms:DOI">https://doi.org/10.17863/CAM.111648</dc:identifier>
   <dc:creator>Zulqurnain, Muhammad</dc:creator>
   <uketdterms:authoridentifier xsi:type="uketdterms:ORCID">000000026612049X</uketdterms:authoridentifier>
   <uketdterms:advisor>Ritchie, David</uketdterms:advisor>
   <dcterms:abstract>Modern electronic and optoelectronic device industry is shifting from conventional rigid and
bulky devices to smarter, flexible, transparent, economical, extra efficient and multifunctional
devices. III-V semiconductor materials are an integral part of these devices due to their
superior optical properties and electron mobilities as compared to silicon. However, the
use of III-V semiconductor materials is currently reserved for high specification use cases.
Two key challenges, which limit their application to emerging technology products are cost
and integration. One approach to minimise the cost is to adopt thin films of these materials
which can be released from its substrate and heterointegrated with silicon or transferred to
flexible substrates. This is of particular interest for energy conversion devices. However, the
fabrication of high quality large area thin films at lower cost is still a significant challenge.
This work focuses on the development of the emerging technique of remote epitaxy,
which exploits an atomically thin two-dimensional (2D) material as an interface layer between
a III-V growth substrate and an epitaxial film. For example, 2D material such as graphene
coated on GaAs substrates allows the registry information of the underlying substrate to
permeate through the graphene and facilitate the formation of exact copy of single crystal
growth template. Therefore, the grown layer would replicate the crystal orientation of the
underlying substrate. The critical advantage of this technique is that the film is only bonded
to the graphene with a Van der Waal’s bond, allowing it to be readily released from the growth
substrate non-destructively and subsequently bonded to an alternative flexible substrate to
fabricate optoelectronic devices.
In this work, we fabricate GaAs thin films epitaxially on graphene coated substrates. I
have shown that the CVD graphene grown on Cu, wet transferred to a GaAs substrate can be
used as an interface layer for the growth of single crystal epitaxial GaAs films and subsequent
exfoliation. We observe wet transfer of graphene leads to the formation of a native oxide
layer at the graphene/substrate thus widening the gap between graphene and the substrate.
This hinders the remote interaction from the substrate. To mitigate the problem of oxide layer
formation we exposed graphene to an Ar-ion beam to create pinhole defects. This allows
the desorption of native oxides at elevated temperature and the nucleation of GaAs at defect sites followed by lateral overgrowth. The epilayer is exfoliated from the growth substrate
revealing the nucleation of the epilayer through pinholes. We also explore the possibility of
semi-dry transferred CVD graphene to avoid native oxide growth at the graphene interface,
reducing the need for defect seeding of the epitaxial layer. The processes demonstrated in
this work would significantly reduce the cost of fabricating thin films and pave the way for
their industrial scale adoption.</dcterms:abstract>
   <uketdterms:institution>University of Cambridge</uketdterms:institution>
   <dcterms:issued>2023-04</dcterms:issued>
   <dc:type>Thesis</dc:type>
   <uketdterms:qualificationlevel>Doctoral</uketdterms:qualificationlevel>
   <uketdterms:qualificationname>Doctor of Philosophy (PhD)</uketdterms:qualificationname>
   <dc:language>eng</dc:language>
   <uketdterms:sponsor>EPSRC (EP/L016087/1)
Engineering Department of University of Cambridge, Funded for 6 months</uketdterms:sponsor>
   <dcterms:isReferencedBy xsi:type="dcterms:URI">https://www.repository.cam.ac.uk/handle/1810/373085</dcterms:isReferencedBy>
   <dc:identifier xsi:type="dcterms:URI">https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/3c6f8e0d-737c-4faf-a908-daeccd0603f7/download</dc:identifier>
   <uketdterms:checksum xsi:type="uketdterms:MD5">4b3381578a86a8cab8da738a80039cf9</uketdterms:checksum>
   <dcterms:license>https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/6444f304-53ef-4fe4-b4f3-dced66fadf1f/download</dcterms:license>
   <uketdterms:checksum xsi:type="uketdterms:MD5">87eda9de84448d1f82354d60eee3eb5f</uketdterms:checksum>
   <dc:rights>https://www.rioxx.net/licenses/all-rights-reserved/</dc:rights>
   <dc:subject>Remote Epitaxy</dc:subject>
   <dc:subject>Graphene</dc:subject>
   <dc:subject>Molecular beam epitaxy</dc:subject>
   <dc:subject>Thin films</dc:subject>
</uketd_dc:uketddc>
</metadata></record></GetRecord></OAI-PMH>