<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-23T19:44:09Z</responseDate><request verb="GetRecord" identifier="oai:www.repository.cam.ac.uk:1810/34602" metadataPrefix="uketd_dc">https://api.repository.cam.ac.uk/server/oai/request</request><GetRecord><record><header><identifier>oai:www.repository.cam.ac.uk:1810/34602</identifier><datestamp>2025-12-19T21:36:21Z</datestamp><setSpec>com_1810_34587</setSpec><setSpec>com_1810_34586</setSpec><setSpec>com_1810_256064</setSpec><setSpec>col_1810_34589</setSpec><setSpec>col_1810_205358</setSpec></header><metadata><uketd_dc:uketddc xmlns:uketd_dc="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:uketdterms="http://naca.central.cranfield.ac.uk/ethos-oai/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/ http://naca.central.cranfield.ac.uk/ethos-oai/2.0/uketd_dc.xsd">
   <dc:title>Novel applications of the Josephson Effect: Ferroelectric Characterisation and Capacitively Shunted Grain Boundary Junctions</dc:title>
   <dc:identifier xsi:type="dcterms:DOI">10.17863/CAM.14197</dc:identifier>
   <dc:creator>McBrien, Philip Francis</dc:creator>
   <dcterms:abstract>This thesis describes applications of the ac Josephson effect. Firstly, results are presented&#xd;
from bicrystal grain boundary YBa2Cu3O7-d junctions shunted with a YBa2Cu3O7-d/SrTiO3/Au&#xd;
multilayer external capacitor, to make a junction with a hysteretic current voltage characteristic&#xd;
operating at high temperatures. A hysteretic junction with a McCumber parameter of 1.01 at&#xd;
72.3K, with a critical current of 451mA and a resistance of 0.56W was achieved for a junction&#xd;
shunted with a 150mm2 external capacitor with a 50nm SrTiO3 dielectric. The measured&#xd;
capacitance was less than that expected from a calculation of the parallel plate shunt&#xd;
capacitance. The explanation was thermal noise suppression of the hysteresis and the junction&#xd;
saw the shunt capacitor as a distributed impedance rather than a lumped circuit element.&#xd;
It was found during these investigations that the influence of the SrTiO3 substrate on the&#xd;
intrinsic junction capacitance was poorly understood. The permittivity of SrTiO3 is 24000 at&#xd;
4.2K. A series of YBa2Cu3O7-d Josephson junctions of lengths from 2mm to 20mm was&#xd;
patterned on a SrTiO3 bicrystal and the Fiske resonance dispersion relation was measured. The&#xd;
dispersion relation consisted of two branches, one at low frequencies with a high resonator&#xd;
capacitance per unit length and a high frequency branch with a low resonator capacitance per&#xd;
unit length. This was due to the frequency dependence of the permittivity of bulk SrTiO3,&#xd;
which drops above the soft optic phonon frequency. From the dispersion relation, the&#xd;
permittivity of bulk SrTiO3 was 750 and the soft optic phonon frequency was 145GHz.&#xd;
The ac Josephson effect was exploited to measure the permittivity of thin films of&#xd;
SrTiO3 at microwave frequencies using Josephson junctions coupled to external resonators.&#xd;
The permittivity of 50nm, 100nm and 200nm SrTiO3 films was frequency independent&#xd;
between 100GHz and 900GHz and to decrease with film thickness. The permittivity of the&#xd;
50nm film was 35 and that of the 200nm film was 187 at 4.2K. The permittivity of the 200nm&#xd;
film was tunable with a dc voltage bias between 245 and 112 at 30K and 116GHz.&#xd;
The grain boundary capacitance was used to probe grain boundary current transport. The&#xd;
capacitance per unit area scaled inversely with resistance area product and increased linearly&#xd;
with critical current density, for undoped and Ca doped YBa2Cu3O7-d grain boundaries on 24°&#xd;
bicrystals. This behaviour could not be explained by tunneling models of grain boundary&#xd;
current transport, and requires current flow over a fraction of the area of the grain boundary.</dcterms:abstract>
   <uketdterms:institution>University of Cambridge</uketdterms:institution>
   <dcterms:issued>2000-09</dcterms:issued>
   <dc:type>Thesis</dc:type>
   <uketdterms:qualificationlevel>Doctoral</uketdterms:qualificationlevel>
   <uketdterms:qualificationname>Doctor of Philosophy (PhD)</uketdterms:qualificationname>
   <dc:language>en</dc:language>
   <uketdterms:sponsor>EPSRC</uketdterms:sponsor>
   <dcterms:isReferencedBy xsi:type="dcterms:URI">http://www.dspace.cam.ac.uk/handle/1810/34602</dcterms:isReferencedBy>
   <dcterms:isReferencedBy xsi:type="dcterms:URI">https://www.repository.cam.ac.uk/handle/1810/34602</dcterms:isReferencedBy>
   <dc:identifier xsi:type="dcterms:URI">https://www.repository.cam.ac.uk/bitstreams/b73d020b-69b0-4db9-bd0e-ea828bcf2d25/download</dc:identifier>
   <uketdterms:checksum xsi:type="uketdterms:MD5">203dfce21cb4df43cdde0755b9a6ee3b</uketdterms:checksum>
   <dcterms:license>https://www.repository.cam.ac.uk/bitstreams/8f264e98-bb02-4cb1-858b-b70e450a239c/download</dcterms:license>
   <uketdterms:checksum xsi:type="uketdterms:MD5">e1741a7f49dc4903e0d23e1728da0b84</uketdterms:checksum>
   <dc:rights>https://www.rioxx.net/licenses/all-rights-reserved/</dc:rights>
   <dc:subject>Grain Boundaries</dc:subject>
   <dc:subject>YBCO</dc:subject>
   <dc:subject>Josephson Junctions</dc:subject>
   <dc:subject>Devices</dc:subject>
</uketd_dc:uketddc>
</metadata></record></GetRecord></OAI-PMH>