<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-21T05:13:13Z</responseDate><request verb="GetRecord" identifier="oai:www.repository.cam.ac.uk:1810/313908" metadataPrefix="uketd_dc">https://api.repository.cam.ac.uk/server/oai/request</request><GetRecord><record><header><identifier>oai:www.repository.cam.ac.uk:1810/313908</identifier><datestamp>2025-04-09T12:06:12Z</datestamp><setSpec>com_1810_34586</setSpec><setSpec>com_1810_256064</setSpec><setSpec>col_1810_205358</setSpec></header><metadata><uketd_dc:uketddc xmlns:uketd_dc="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:uketdterms="http://naca.central.cranfield.ac.uk/ethos-oai/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/ http://naca.central.cranfield.ac.uk/ethos-oai/2.0/uketd_dc.xsd">
   <dc:title>Structure Solution Using Precession Electron Diffraction and Diffraction Tomography</dc:title>
   <dc:identifier xsi:type="dcterms:DOI">10.17863/CAM.61012</dc:identifier>
   <dc:creator>White, Thomas A.</dc:creator>
   <dcterms:abstract>This thesis concerns the application of electron diffraction to the problem of structure&#xd;
solution. The technique of precession electron diffraction, in particular, is discussed as a&#xd;
method to improve the applicability of methods borrowed from X-ray crystallography to&#xd;
intensities measured from electron diffraction.&#xd;
&#xd;
Simulations are presented which demonstrate that diffracted intensities with precession&#xd;
electron diffraction are less sensitive to the phases of structure factors compared to those&#xd;
recorded without, consistent with the intensities becoming “more kinematical” in nature.&#xd;
&#xd;
The technique of automated diffraction tomography is developed. Transformations are&#xd;
derived which map the positions of diffraction maxima into three-dimensional reciprocal&#xd;
space following an automated peak detection process. The factors which complicate the&#xd;
process of unit cell determination are discussed, and an algorithm designed for autoindexing &#xd;
“obstinate” lists of X-ray reflections was found to be able to determine the unit cells accurately. &#xd;
Intensity measurements from the tomographically acquired diffraction patterns&#xd;
were taken in an automated fashion using this method, and Patterson maps calculated&#xd;
which were comparable with maps calculated from zone-axis precession electron diffraction&#xd;
intensities or kinematical simulation. An algorithm for geometrical refinement of the unit&#xd;
cell and tilting geometry is proposed.&#xd;
&#xd;
Finally, the application of the technique of precession electron diffraction, combined&#xd;
with techniques developed in the course of this research, is described in the context of&#xd;
the partial solution of an unknown intermediate form of tin oxide. The results support a&#xd;
revised form of a structure recently proposed from ab-initio structure simulations, with a&#xd;
tin sublattice similar to a supercell of the rutile structure of SnO2. Some signs of oxygen&#xd;
atoms were found in the Fourier maps, but the results of a least-squares refinement were&#xd;
unsatisfactory.</dcterms:abstract>
   <uketdterms:institution>University of Cambridge</uketdterms:institution>
   <dcterms:issued>2009-09</dcterms:issued>
   <dc:type>Thesis</dc:type>
   <uketdterms:qualificationlevel>doctoral</uketdterms:qualificationlevel>
   <uketdterms:qualificationname>PhD</uketdterms:qualificationname>
   <dc:language>en</dc:language>
   <dcterms:isReferencedBy xsi:type="dcterms:URI">https://www.repository.cam.ac.uk/handle/1810/313908</dcterms:isReferencedBy>
   <dc:identifier xsi:type="dcterms:URI">https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/7b6446d1-1a32-4577-b205-4cc7b4f5327d/download</dc:identifier>
   <uketdterms:checksum xsi:type="uketdterms:MD5">9d6bed932718a53e85dac1ab60258f79</uketdterms:checksum>
   <dcterms:license>https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/56353922-7fa5-47bd-84b4-319cb8c650c9/download</dcterms:license>
   <uketdterms:checksum xsi:type="uketdterms:MD5">87eda9de84448d1f82354d60eee3eb5f</uketdterms:checksum>
   <dc:rights>https://www.rioxx.net/licenses/all-rights-reserved/</dc:rights>
   <dc:subject>tomography</dc:subject>
   <dc:subject>diffraction</dc:subject>
   <dc:subject>electron</dc:subject>
</uketd_dc:uketddc>
</metadata></record></GetRecord></OAI-PMH>