<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-21T10:13:42Z</responseDate><request verb="GetRecord" identifier="oai:www.repository.cam.ac.uk:1810/295214" metadataPrefix="uketd_dc">https://api.repository.cam.ac.uk/server/oai/request</request><GetRecord><record><header><identifier>oai:www.repository.cam.ac.uk:1810/295214</identifier><datestamp>2022-08-25T02:32:54Z</datestamp><setSpec>com_1810_34586</setSpec><setSpec>com_1810_256064</setSpec><setSpec>col_1810_205358</setSpec></header><metadata><uketd_dc:uketddc xmlns:uketd_dc="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:uketdterms="http://naca.central.cranfield.ac.uk/ethos-oai/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/ http://naca.central.cranfield.ac.uk/ethos-oai/2.0/uketd_dc.xsd">
   <dc:title>Crystal Cartography: Mapping Nanostructure with Scanning Electron Diffraction</dc:title>
   <dc:identifier xsi:type="dcterms:DOI">10.17863/CAM.42276</dc:identifier>
   <dc:creator>Johnstone, Duncan Neil</dc:creator>
   <uketdterms:authoridentifier xsi:type="uketdterms:ORCID">0000000336633793</uketdterms:authoridentifier>
   <uketdterms:advisor>Midgley, Paul Anthony</uketdterms:advisor>
   <dcterms:abstract>Nanostructure describes the network of defective and distorted atomic structure existing
on the nanoscale within materials. This nanostructure bridges the gap between idealised crys-
talline structure and real materials, playing a deterministic role in tailoring physico-chemical
properties, as well as providing a basis for mechanistic understanding of complex processes
such as mechanical deformation and phase transformation. Characterising nanostructure, to
develop understanding of materials, requires experimental techniques capable of probing the
structure with spatial resolution on the order of nanometres and across regions of interest
up to micrometres. Recent developments in electron microscopy, enabling the acquisition
of numerous diffraction patterns in a spatially resolved manner, combined with modern
computational power, provides a route to meet this need as developed in this work.

Scanning electron diffraction (SED) involves the acquisition of a two-dimensional elec-
tron diffraction pattern at each probe position in a two-dimensional scan of a specimen. An
information rich 4-dimensional (4D-SED) dataset is obtained that can be analysed extensively
post-facto using a wide-range of computational methods. The acquisition of such 4D-SED
data from the specimen at numerous orientations may also enable the reconstruction of
nanostructure in three-dimensions via tomographic methods. In this work, methods for the
acquisition and analysis of 4D-SED data are developed and applied to reveal nanostructure in
two and three-dimensions. These methods are applied to various prototypical characterisation
challenges in materials science, particularly: strain mapping in two and three dimensions,
revealing inter-phase crystallographic relationships, mapping grains in two-dimensional
materials, and probing nanostructure in polyethylene.</dcterms:abstract>
   <uketdterms:institution>University of Cambridge</uketdterms:institution>
   <dcterms:issued>2019-08-23</dcterms:issued>
   <dc:type>Thesis</dc:type>
   <uketdterms:qualificationlevel>Doctoral</uketdterms:qualificationlevel>
   <uketdterms:qualificationname>Doctor of Philosophy (PhD)</uketdterms:qualificationname>
   <dc:language>en</dc:language>
   <dcterms:isReferencedBy xsi:type="dcterms:URI">https://www.repository.cam.ac.uk/handle/1810/295214</dcterms:isReferencedBy>
   <dc:identifier xsi:type="dcterms:URI">https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/8c9a60b8-d448-4f62-81d8-b6aadea74cf9/download</dc:identifier>
   <uketdterms:checksum xsi:type="uketdterms:MD5">83f85a1ee986acdbd08f0e47052f8801</uketdterms:checksum>
   <dcterms:license>https://apollo8-f-pro.lib.cam.ac.uk/bitstreams/bf2dde2b-6dcc-456b-8302-2a99a9cb47d7/download</dcterms:license>
   <uketdterms:checksum xsi:type="uketdterms:MD5">87eda9de84448d1f82354d60eee3eb5f</uketdterms:checksum>
   <dc:rights>https://creativecommons.org/licenses/by-nc-sa/4.0/</dc:rights>
   <dc:subject>scanning electron diffraction</dc:subject>
   <dc:subject>electron crystallography</dc:subject>
   <dc:subject>diffraction</dc:subject>
   <dc:subject>crystallography</dc:subject>
   <dc:subject>scientific software</dc:subject>
</uketd_dc:uketddc>
</metadata></record></GetRecord></OAI-PMH>